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semiconductor-manufacturing

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Wafers-Defect-Recognition-using-Visual-Transformer

We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.

  • Updated Oct 1, 2023
  • Jupyter Notebook

WaferDetect is an AI-powered wafer-map defect intelligence platform for semiconductor fabs that segments failure patterns in silicon wafers with AI, diagnoses their root causes and possible errors in the manufacturing process, and quantifies the wafer map die yield loss in dollars.

  • Updated Jul 9, 2026
  • Python

High-fidelity process simulation dashboard built in Python. Features include Deal-Grove thermal oxidation (calibrated to BYU standards), Gaussian ion implantation profiling, and selective etch rate modeling with real-time cross-sectional visualization.

  • Updated Mar 31, 2026
  • Python

Calculating semiconductor chip yield against defect density using a Monte Carlo simulation is a common approach to assess the impact of defects on chip manufacturing. In this simulation, we'll randomly generate defect locations and evaluate chip yield based on specified criteria.

  • Updated Dec 1, 2023
  • Jupyter Notebook

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