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  1. lithography-cd-control-jmp lithography-cd-control-jmp Public

    JMP-based lithography line-width CD control, SPC, ANOVA, and process capability analysis using NIST wafer data.

  2. lithography-focus-dose-yield-analysis-jmp lithography-focus-dose-yield-analysis-jmp Public

    JMP-based lithography focus-dose process window and yield analysis using public exposure and inspection data.

  3. wafer-level-ic-yield-analysis-jmp wafer-level-ic-yield-analysis-jmp Public

    Wafer-level IC yield analysis using JMP for semiconductor pilot manufacturing process comparison.

  4. mems-piezoresistive-pressure-sensor mems-piezoresistive-pressure-sensor Public

    Fabrication and characterization of a MEMS piezoresistive pressure sensor using silicon micromachining, photolithography, ion implantation, metallization, anodic bonding, and device testing.