xrr

Differentiable X-ray reflectivity modeling, neural inference and physics-based refinement for thin films

Cross-Replication Reliability Measure (xRR)

Deep learning extraction of thin-film thickness, roughness and density from X-ray reflectivity

Data behind Penkov, Peng and Fu: measured Co/C curves, the expert's reference fits, every fit job, the agent session transcripts, and the scripts and figures of the paper.

A laboratory's X-ray reflectivity fitting procedure, written so a language-model agent can follow it. Includes the four versions used in the published study, and what transferred between material systems and what did not.

Neural network for thin-film parameters from X-ray reflectivity, with a differentiable Abeles simulator

XRR thin-film analysis: CNN initial guess of thickness, roughness and SLD refined with GenX

Simple thickness determination of thin films from XRR (X-ray reflectometry) data based on Fourier Transform.

Analyzing X-ray reflectometry data using the Parratt recursion formalism with Nevot-Croce roughness corrections.