Add tests for mask_list in ImageMaskInput#1750
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Summary: Add a new `mask_list` argument to `ImageMaskInput` that allows defining overlapping features on the same pixel. Unlike `mask` where each pixel belongs to exactly one feature, `mask_list` accepts a list of binary masks where each mask indicates one feature. This enables more flexible image segmentation for attribution analysis - Added `mask_list` parameter that takes precedence over `mask` when provided - Updated `to_model_input` to handle both `mask_list` and `mask` modes - Updated `format_pixel_attr` to sum attributions from overlapping features when using `mask_list` (sum attr is not the best choice to represent overlapped pixels, up to change later) Differential Revision: D89949211
Summary: as title Differential Revision: D89952326
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Summary: as title Differential Revision: D89952326
aobo-y
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Dec 31, 2025
Summary: as title Differential Revision: D89952326
aobo-y
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that referenced
this pull request
Dec 31, 2025
Summary: as title Differential Revision: D89952326
aobo-y
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to aobo-y/captum
that referenced
this pull request
Dec 31, 2025
Summary: as title Differential Revision: D89952326
aobo-y
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to aobo-y/captum
that referenced
this pull request
Dec 31, 2025
Summary: as title Differential Revision: D89952326
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This pull request has been merged in 1f46cc4. |
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Summary: as title
Differential Revision: D89952326