[1.7][TC-OPCREDS-3.9][TC-DA-1.10, 11, 12, 13] Add SDK and Sample App Implementation for Newly added Features, Attributes.

[Pavan-saiv]

Test Case

TC-OPCREDS-3.9 and TC-DA-1.10, 11, 12, 13

Description

• In Node Operational Credentials cluster, PQCDeviceAttestation feature, PQCDeviceAttestationProfile attribute is newly introduced in 1.7. However, SDK support for these elements are currently not available. Hence, SDK and Sample app implementation needs to be added to enable verification of these features and attribute Functionality.

• In Device Attestation cluster, TC-DA-1.10, 1.11, 1.12, 1.13 testcases are newly introduced in 1.7. However, SDK support for validating these testcases functionality are currently not available. Hence, SDK and Sample app implementation needs to be added to enable verification of these PQCDeviceAttestation feature and PQCDeviceAttestationProfile attribute Functionality.

Reproduction steps:

Executed the below mentioned command to put DUT into a commissionable state:
./chip-all-clusters-app

Once DUT reach the commissionable state sent below mentioned command on TH:
./chip-tool pairing onnetwork 1 20202021

After the successful commissioning, I attempted to read Featuremap but, the features are not available in Sample app(all-clusters-app).

Command used to read feature-map: ./chip-tool operationalcredentials read feature-map 1 0

[1783589672.137] [124852:124854] [TOO] Endpoint: 0 Cluster: 0x0000_003E Attribute 0x0000_FFFC DataVersion: 1316711582
[1783589672.137] [124852:124854] [TOO] FeatureMap: 0
[1783589672.137] [124852:124854] [EM] <<< [E:29793i S:57063 M:225624029 (Ack:244893563)] (S) Msg TX from 000000000001B669 to 1:0000000000000001 [E7C8] [UDP:[fe80::8495:ceff:fe77:6bb4%vethd9a3a5b]:5540] --- Type 0000:10 (SecureChannel:StandaloneAck) (B:34)

GitHub hash of the SDK that was being used

8f2684b

Anything else?

Specification PR References:

• https://github.com/CHIP-Specifications/connectedhomeip-spec/pull/12833

Test plan PR References:

• https://github.com/CHIP-Specifications/chip-test-plans/pull/6227